Panels
TUESDAY, MAY 29, 2018
18:00 - 19:30 SESSION 4A: Panel 1
The Future of Test (Community): Ask the Experts!
All attendees will be able to submit written questions in advance at the Registration or Opening Session, and selected questions will be posed to an appropriate expert in the room (and you may be one of the experts!) for discussion and rebuttal. Awards will be given for the best question, the best expert answer, and the best audience rebuttal. Questions can address any topic, but those with a forward-looking theme about the future of test and the test community are of particular interest.
Small food and drinks are provided.
18:00 - 19:30 SESSION 4A: Panel 1
Wine & Cheese Panel
| Organizers: | Jeff REARICK, AMD - USA Mehdi TAHOORI, Karlsruhe Institute of Technology - Germany |
| Moderator: | Jeff REARICK, AMD - USA |
The Future of Test (Community): Ask the Experts!
All attendees will be able to submit written questions in advance at the Registration or Opening Session, and selected questions will be posed to an appropriate expert in the room (and you may be one of the experts!) for discussion and rebuttal. Awards will be given for the best question, the best expert answer, and the best audience rebuttal. Questions can address any topic, but those with a forward-looking theme about the future of test and the test community are of particular interest.
Small food and drinks are provided.
WEDNESDAY, MAY 30, 2018
Is Machine Learning Really Useful for Test & Reliability?
This panel discusses whether machine learning is really useful for industrial chip/system manufacturing test and customer field reliability operation and maintenance. It will also cover what the costs and difficulties are if machine learning is useful in these areas and how we can possibly reduce or overcome these issues.
Panelists:
13:30 - 15:00 SESSION 6A: Panel 2
| Organizer and Moderator: | Xinli GU, Huawei - USA |
Is Machine Learning Really Useful for Test & Reliability?
This panel discusses whether machine learning is really useful for industrial chip/system manufacturing test and customer field reliability operation and maintenance. It will also cover what the costs and difficulties are if machine learning is useful in these areas and how we can possibly reduce or overcome these issues.
Panelists:
- Harry CHEN, Mediatek - Taiwan
- Pete HARROD, Arm Inc.- England
- Krishnendu CHAKRABARTY, Duke University - USA
- Zhiyuan WANG, Huawei - USA
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