Workshop
on Test Methods and Reliability of Circuits and Systems (TuZ 2022)



Deadline for paper submission:
November 19, 2021 (extended date)
Notification of acceptance:
December 17, 2021
Submission of camera-ready version:
January 21, 2022 (extended date)
Submission of presentation:
February 21, 2022

Contact

General Chair

Dr.-Ing. Sebastian Huhn
Senior Researcher
University of Bremen
Bibliothekstraße 5
28359 Bremen
E-Mail: huhn@uni-bremen.de

Program Chair

Prof. Dr.-Ing. Görschwin Fey
Professor for Computer Engineering
Hamburg University of Technology
Am Schwarzenberg-Campus 3 (E)
21073 Hamburg
E-Mail: goerschwin.fey@tuhh.de




Web, Print Media & Photography
Lisa Jungmann,
University of Bremen / DFKI GmbH

Local Organization
Kristiane Schmitt,
DFKI GmbH




Organizer

VDE Association for Electrical, Electronic and Information Technologies
Gesellschaft Mikroelektronik, Mikrosystem- und Feinwerktechnik (GMM)
Dr. Ronald Schnabel
Stresemannallee 15
60596 Frankfurt/Main