Given today's fast growing automotive semiconductor industry, this session will discuss the implications of automotive test on reliability and functional safety during the system lifecycle. This will include design, silicon bring-up, volume production, and particularly in-system test stages. Today's automotive safety critical chips need multiple in-system self-test modes, such as power-on self-test and repair, periodic in-field self-test, advanced error correction solutions, etc. This session will analyze these in-system test modes and the discuss the benefits of using ISO 26262 certified solutions, in order to ensure that standardized functional safety requirements are met, while accelerating time to market for automotive chips.