BOOM-Explorer: RISC-V BOOM Microarchitecture Design Space Exploration Framework
Chen Bai, The Chinese University of Hong Kong, Qi Sun, The Chinese University of Hong Kong, Jianwang Zhai, Tsinghua University,
Yuzhe Ma, The Chinese University of Hong Kong, Bei Yu, The Chinese University of Hong Kong, Martin Wong, The Chinese University of Hong Kong
Analytical Modeling of Transient Electromigration Stress based on Boundary Reflections
Mohammad Abdullah Al Shohel, University of Minnesota, Vidya A. Chhabria, University of Minnesota, Nestor Evmorfopoulos, University of Thessaly,
Sachin S. Sapatnekar, University of Minnesota